BE494753A - - Google Patents
Info
- Publication number
- BE494753A BE494753A BE494753DA BE494753A BE 494753 A BE494753 A BE 494753A BE 494753D A BE494753D A BE 494753DA BE 494753 A BE494753 A BE 494753A
- Authority
- BE
- Belgium
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/91—Investigating the presence of flaws or contamination using penetration of dyes, e.g. fluorescent ink
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US1018820XA | 1949-03-26 | 1949-03-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
BE494753A true BE494753A (en]) |
Family
ID=22286936
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BE494753D BE494753A (en]) | 1949-03-26 |
Country Status (3)
Country | Link |
---|---|
BE (1) | BE494753A (en]) |
DE (1) | DE833260C (en]) |
FR (1) | FR1018820A (en]) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1109918B (de) * | 1955-02-01 | 1961-06-29 | Siemens Ag | Verfahren zum Sichtbarmachen von bis zur Oberflaeche durchgehenden Rissen oder Spalten in Metallstuecken |
DE1192852B (de) * | 1957-12-13 | 1965-05-13 | Licentia Gmbh | Verfahren zum Feststellen von Strukturfehlern an der Oberflaeche von Halbleiterkoerpern |
DE1207663B (de) * | 1958-08-07 | 1965-12-23 | Helmut Klumpf | Verfahren zur Pruefung von Werkstuecken auf Oberflaechenfehler und mit der Oberflaeche in Verbindung stehende Fehlstellen |
CN110118780B (zh) * | 2019-05-15 | 2025-01-03 | 浙江大学 | 用于大坝裂缝检测的喷墨示踪装置 |
-
0
- BE BE494753D patent/BE494753A/xx unknown
-
1950
- 1950-03-24 DE DET648A patent/DE833260C/de not_active Expired
- 1950-03-25 FR FR1018820D patent/FR1018820A/fr not_active Expired
Also Published As
Publication number | Publication date |
---|---|
FR1018820A (fr) | 1953-01-13 |
DE833260C (de) | 1952-03-06 |